Published: July 10, 2011
Advantest to Feature New SOC and NAND Test Solutions at SEMICON West
SANTA CLARA, Calif. - (BUSINESS WIRE) - Advantest Corporation (TSE: 6857, NYSE: ATE), the world's leading
supplier of semiconductor test equipment, today announced it will
showcase the latest additions to its portfolio of IC test solutions
during SEMICON West 2011, July 12-14. The company will feature products
and solutions that help to lower the cost of test and boost productivity
for a variety of SOC applications, including an Enhanced Performance
Package (EPP) for multi-functional ICs such as those used in mobile
devices, and an Integrated Power Solution (IPS) for power ICs used in
automotive and consumer electronics. Advantest will also introduce two
new solutions that together offer total test support for
next-generation, high-efficiency, high-speed NAND flash memory devices,
from front to back end. The company's T5773 is a high-parallel,
high-efficiency NAND flash package tester, and the new HA5100CELL, is a
new one-touch, 4 wafer parallel test solution for NAND flash wafer test.
These solutions and more will be displayed in booth 6665, at Moscone
Center's North Hall.
Keith Lee, president and CEO of Advantest America, Inc., commented, "To
keep pace with the downward pricing pressures that define the current
market environment, our customers are calling for lower cost, but
reliable, high-volume test solutions for devices that are both complex
and dense. We are pleased to be able to continue our long history of
delivering technically superior test solutions, and understand that in
today's fab flow, particularly with increasing semiconductor varieties
and complexities, the ability to test and know the integrity of devices
in a production environment is critical. We stay committed to providing
our customers a competitive cost of ownership through innovative
technology, reliability and cost-effective test solutions."
Advantest's commitment to innovative R&D further elevates SoC ATE
performance
The T2000 's Enhanced Performance Package (EPP) delivers distributed
instrument and test execution control which achieves the ATE industry's
highest available multisite parallel efficiency as well as the easiest
path to true-concurrent mixed-signal test operation. Combined with the
T2000's existing test-time advantages and instrument density leadership,
this capability extends the T2000's COT leadership. Additional EPP
technological capabilities add rapid design-flow support for
verification and characterization processes by accepting higher-level
programming input - effectively abstracting conventional vector programs
into higher level frame and packet interactions at the protocol level.
In addition to the EPP, Advantest is showcasing a new set of
multi-functional instruments including the 1GDM, the DPS90A and the
GPWGD, providing the instrument density required to achieve the highest
parallel testing and integration of multiple functions into one module,
helping to reduce the overall cost of test and provide the widest test
coverage for complex SOCs.
With the Enhanced Performance Package and instrumentation, Advantest and
the T2000 once again raise the industry standard for throughput, COT,
and time-to-market.
EP Package: Features
Multi-Site CPU Configuration
The T2000 drives the industry's highest multisite parallel efficiency,
making multisite CoT reduction easier than ever.
Concurrent Test Function
'Instrument Slicing' Bus and distributed computing architecture within
the EP Package enables simultaneous execution of multiple test flows for
dramatic test time reduction and easy correlation of concurrent test
flows.
Functional Test Abstraction
Execution of system level design verification programs within the T2000
to reduce device debug/characterization timetables.
New Modules:
1GDM
Advantest's new 1GDM module incorporates 256 channels, 256M Pattern
Memory, dual mode sequencers for Protocol and conventional pattern
execution, data rates up to 1.1Gbps, built-in histogram engine and
multi-bank capture memory for mixed signal testing
DPS90A
The DPS90A is a 64 channel universal DPS and VI source combined into one
module. DPS90A combines the capabilities of three current generation
instruments into one providing the widest device test coverage at the
lowest COT ideal for production test houses
GPWGD
The GPWGD is a general purpose arbitrary waveform generator and
digitizer module consolidating the functions of two previously available
modules into a single highly integrated configuration, enabling test of
high-performance audio and video devices.
Integrated power device solution for multifunctional power ICs
Advantest's Integrated Power Device Test Solution (IPS) incorporates a
high-power module, a Matrix Module and a High-Voltage Mixed-Signal
Module that deliver a comprehensive, configurable solution for
"one-stop" test of multifunctional power Ics such as those used in
automotive and consumer electronics. The solution is supported by a
dedicated set of software-tools developed to serve the specific test
requirements of this industry. The new solution provides easy and
efficient multisite testing of power devices within the
open-architecture T2000 environment, meeting an urgent need for
cost-effective power device reliability test.
The IPS solution combines multiple test functions on one module,
enabling multisite test capability 4x greater than previously achieved.
This level of functionality becomes more critical as the number of pins
on a given device increase in proportion to the number of chips
incorporated into automobiles to improve passenger safety, convenience
and in-car entertainment With Advantest's new power device test
solutions, manufacturers can now customize their test systems with a
High-Power Module, a High-Voltage Mixed Signal Module and a Matrix
Module to enable devices with a range of pin counts to be tested with an
optimal configuration.
NAND flash test solutions offering total device test support from
wafer test to volume production
-
HA5100CELL for front-end NAND flash test
The Harmonic Architecture (HA) platform is another industry first from
Advantest: an all-in-one wafer test solution that combines a tester and
prober in a single tool, and four test cells into one. With the
capability to test four wafers at once, the HA5100CELL is a dedicated
NAND flash memory tester which offers a reduced footprint ¼ the size of
previous systems. It boasts an operating frequency range of 100MHz and a
maximum parallel test capacity of 6,144 DUTs. These innovations deliver
50% test cost savings over previous test cells. The HA5100CELL utilizes
a unique contact compliance technology that enables a one-touch
high-volume contact solution. The HA5100ES, an engineering system for
R&D device evaluation, is also available.
-
T5773 for back-end NAND flash test
Advantest's T5773 is a package test system for NAND flash memory that
supports high-speed interfaces for SSDs, handsets and other
applications, meeting the test needs of device types that demand as much
as 4X the test speed of previous types. The T5773's operating frequency
range is 200MHz / 400Mbps, while the system offers a parallel test
capacity of over 768 DUTs. Additionally, the T5773's innovative design
achieves significant power and floorspace savings, helping to lower
customer test costs dramatically. Advantest also offers the T5773ES, an
engineering system for R&D use.
Technical program participation
Advantest will be active in the technical program at Semicon West, with
A.T. Sivaram delivering a presentation at Wednesday's TechXpot session, Test
in Transition: Emerging Test, Solutions and Technologies. Mr.
Sivaram's presentation is titled, "New Test System Architecture to
Improve Test Methodologies," and will be delivered at 4:00pm. Also
during Semicon West, Advantest's Gary Fleeman, director of business
development, will serve on a panel at IEEE's annual ATE Vision 2020
Workshop. The panel will address the TSV quality imperative, and the
need for closer supply-chain collaboration for highest-quality TSV
stacks.
About Advantest Corporation
A world-class technology company, Advantest is the leading producer of
automatic test equipment (ATE) for the semiconductor industry and a
premier manufacturer of measuring instruments used in the design and
production of electronic instruments and systems. Its leading-edge
systems and products are integrated into the most advanced semiconductor
production lines in the world. The company also focuses on R&D for
emerging markets that benefit from advancements in nanotech and
terahertz technologies, and has recently introduced critical dimension
scanning electron microscopes essential to photomask manufacturing, as
well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo
in 1954, Advantest established its first subsidiary in 1982, in the USA,
and now has subsidiaries worldwide. More information is available at www.advantest.com.
Advantest Corporation
Amy Gold, 212.710.0515
a.gold@advantest.com
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