Keithley Expands MIMO RF Measurement Capabilities With Industry's First 8x8 MIMO Test System

Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, is extending its lead in RF MIMO (multiple-input, multiple-output) test with the industry's first measurement-grade 8x8 MIMO system. The system is used for primary research of next-generation RF MIMO devices and technologies.

Keithley introduced the industry's first 4x4 MIMO test equipment for R&D product development in late 2007. The new 8x8 MIMO system is built on the same award-winning measurement platform that provides capability and performance not found with any other RF test system:

--  support for MIMO research applications ranging from two channels now
    up to eight
--  flexible system configurations with individual system component
    instruments
--  phase and amplitude control of the RF carrier
--  less than +/- 1 nanosecond signal sampler synchronization
--  less than 1 nanosecond peak-to-peak signal sampler jitter
--  less than 1 degree of peak-to-peak RF-carrier phase jitter
    

By allowing for precise and stable multi-unit synchronization with these high performance measurement specifications, the new Keithley system extends support of 4x4 MIMO measurements currently being used for commercial test applications on demanding signals -- such as 802.11n WiFi, 802.16e Mobile WiMAX Wave 2, and future standards such as 4G LTE (Long Term Evolution) and UMB (Ultra Mobile Broadband) -- to the next generation of technologies and methodologies being researched. By providing leading-edge MIMO test systems today, Keithley is well positioned to support its customers as technology research migrates to new product development projects and then into production, thereby helping them speed time-to-market. For more information on Keithley's MIMO RF test solution, visit www.keithley.com/rf.

MIMO is a growing technology that uses multiple radios for both transmitting and receiving data. In RF communication devices, it increases data throughput rates without the need for additional frequency spectrum bandwidth. Keithley's 2x2 through 8x8 MIMO test systems provide the most advanced, high performance MIMO testing platform available for research and product development with the ability to easily test highly complex signals and communication architectures. The Keithley system allows, for the first time, testing of a wide variety of channel configurations using up to eight radios at a time. Research applications include antenna design and configuration testing, beam-forming, evaluating AAS (Adaptive Antenna Systems), and more. The advanced 8x8 MIMO solution provides RF customers with a single measurement platform that supports primary technology research and its migration to product design and development.

Keithley MIMO RF test systems are built on the company's powerful RF signal generator and analyzer platforms that include the Model 2820 RF Vector Signal Analyzers (VSA) with frequency range of 400MHz to 6GHz; the Model 2920 RF Vector Signal Generators (VSG), which can generate frequencies from 10MHz to 6GHz; the Model 280111 WLAN 802.11n Signal Analysis Software, which provides an extensive measurement suite for analyzing up to single- or multiple-channel RF devices with up to 4x4 MIMO configurations; and highly precise and stable signal alignment via Keithley's Model 2895 MIMO Synchronization Unit.

Models 2820 and 2920 are MIMO-ready with all hardware connections and firmware built into every instrument. The instruments provide customers with the flexibility to be used as part of a MIMO test system or to be configured later for use as stand-alone SISO (single-input, single-output) instruments.

Best-in-Class Measurement Performance and Signal Alignment

Keithley's 8x8 MIMO test system provides measurement capabilities not found with any other system on the market:

--  Configurations supporting up to eight channels

--  The most precise and stable alignment found in any MIMO test system

--  Measurement platforms based on DSP-based Software-Defined Radio
    architecture, a highly versatile software architecture to adapt to the
    quickly changing test requirements of the dynamic wireless market. It
    provides a flexible RF test platform that reduces test times with fast
    frequency tuning, amplitude settling, and waveform or measurement switching
    for about half the cost of instruments with similar, or less, performance
    capabilities.

--  Flexibility in instrument configurations, so customers can use the
    instruments in a MIMO test rack, easily expand the number of MIMO channels,
    or as individual instruments.  This not only supports customers as their
    needs evolve from research through production, but also allows customers to
    separate the signal generator sub-system from the signal analyzer sub-
    system if desired.  This flexibility supports the distinct and often
    different requirements researchers and product developers have of their
    test instrumentation.
    

Price and Availability

The base prices of the Model 2820 and Model 2920 instruments are US$25,000 and US$23,000 respectively, while the Model 2895 Synchronization Unit is priced at US$9,900. All units are available six to eight weeks ARO.

For More Information

For more information on any of Keithley's RF measurement products, visit www.keithley.com/rf or contact the company at:

Telephone:  800-688-9951
            440-248-0400
FAX:        440-248-6168
E-mail:     publisher@keithley.com
Internet:   www.keithley.com
Address:    Keithley Instruments, Inc.
            28775 Aurora Road
            Cleveland, OH 44139-1891

About Keithley Instruments, Inc.

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

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